Probe Card Analyzer

Today more complex probe-cards are being used. More pins, higher density and larger arrays require a new approach in probe-card analysis. With the soaring cost of next generation probe-cards, repair of defective cards becomes a necessity. We offers all capabilities with the below list of full wafer contact probe-cards in which can be analyzed with higher test channels. High-end materials are used to stand extra tough requirements.

We offer for your complex probe card analysis requirements.